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FIB for Microcircuit Modification
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Home > Other Testing Service > Failure Analysis Experiments > FIB for Microcircuit Modification
FIB for Microcircuit Modification
FIB(Focused Ion Beam) mainly applies to microcircuit modification & Testing Pad/Probing Pad building.

1.Microcircuit Modification
 FIB can be done directly on metal line for cutting, connectting,fabrication  (through metal deposition)& jumper setting, FIB can also drill holes inside microchip directly, it has obvious advantage in time-effectiveness & costs-consuming while compared with wafer re-verification.

2.Testing Pad/Probing Pad building &Microcircuit Analysis
Building testing pads anywhere inside the complicated microcircuit in order to acquiring IC internal signal with micro probing needles or E-beam tool.
          

                       Microcircuit Modification  e.g:1连2切

          

                                 Cutting Effects