Username: Password:
Register
Homepage IC Test & Verification Other Testing Service Products Design Service Education & Training Value-added Service Standards & Assessments Customer Service About Us CECC Culture Laboratory Tour
 IC Test & Verification
Service Items
Successful Cases
IC Testing Level
Report Samples
Sockets & Fixtures
Test Tariff Standards
Academical Resource
Testing Category
Testing Instruments
General Knowledge
Testing Solutions
Equipment Design
IC Testing Services
Home >IC Test & Verification> General Knowledge
General Knowledge

ESD相关知识:

        FacilityCertificationFlyer                        

FIB相关知识:

       Focused Ion Beam (FIB) Technique

        Magnetic domain structures of focused ion beam-patterned cobalt films using scanning ion microscopy with polarization analysis

        Silicon Slope Evolution under Focused Ion Beam Irradiation

IC测试相关知识:

        chapter11

        Lecture25

        lec9_toolkits