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Home >IC Test & Verification> Level III KFT

                                                                              Level III Key Functional Test
General Description:

     Level III Key Functional Test(KFT), also known as Gross Functional Testing or main functional testing, is a dynamic testing method
performed under specified conditions (usually normal working conditions & normal temperature) to simulate the real application circuit at end users side and carry out necessary logical & signal experiments while not considering the parameters limits (e.g: maximum or minimum value) on the original datasheet to test & verify whether the DUT(Device Under Test) can function normally . Generally, Key Functional Test is a swift test method for gathering information and a relatively fast & low-cost consuming testing method which can meet the requirements of general application circuit of devices.

        For some complex devices circulated among current market, there is no specified testing vector (pattern) provided by OEM, therefore the testing engineers have to assess & design a feasible testing circuit based on the original devices datasheet, specifications, application notes & even end user application circuit. A qualified feasible testing circuit usually enables the devices to run normally in accordance with original datasheet as well as to be monitored & measured by testing equipments & instruments.

        The testing purposes are mainly achieved through regulatory control of peripheral circuits, signal amplification,conversion match etc while connectting the input pins to arbitrary signal generator to impose appropriate, effective incentives (source signals) through peripheral circuit & ports,  the devices output pins were connected to universal tools such as oscilloscope, logic analyzer, spectrum analyzer etc for monitoring & measuring the output wave form, which identifies whether the devices function normally or have any defects. Key Functional Test is a very effective test method applicable to devices with complex functions, sometimes also applicable to the test performed on ATE.

           Generally for the clients from reseller market such as brokers,distributors, suppliers,vendors,buyers, resellers etc, It's much enough to conduct Level III Key Functional Test.

        Why choose KFT?

         Key Functional Test (KFT) is performed to verify the functional status whether the devices can run & operate normally at the end-user side, naturally it's an end user application-oriented testing method. 

         KFT is an effective & economical testing method which especially embodies its obvious influences in the open market. The economic factors & considerations are usually the most important factors to determine & affect what test items, which test method should apply to specified devices.  Products test will greatly increase additional devices manufacturing costs and inevitably affect the whole supply chain in the form of the adjustment of commodity price  in the open market. So test charges affects devices price and vice versa. e.g: a same device only charges  $0.15 /pc for game application testing while charges $350 /pc for satellite application testing. why so much differences? It's simply because this device was used in different application field and different applications have different technical specifications, requiring different testing procedures,methods & programs. 

            The device for satellite applicatin can afford the expensive testing charges of $350 per piece, while the device for game application can only afford the maximum test charges of $0.15 per piece!

            Test Items:

            1. Chemical decapsulation of one random piece of the samples.(default but charge additionally)

            2. Verify the wafer validity, whether the main functions of the DUT are consistent with original datasheet / OEM.

            3. Verify whether the device function can meet end users' requirments (Precaution /alert need to submit for dedicated devices for special purposes).

            4.  Blank Checking,verify whether the device was used or not. (Check whether it has been burned with program or data inside MCU / Memory / FPGA etc.)


       Sample Test Report:

Test Tariff standards & Lead-time:
        1.Subject to the actual device submitted for testing, lead-time normally 5-10 working days.
        2. The key factors affect the testing charges are device functions, packages, test items, quantities etc.
        3. The test charges are usually consists of two parts: engineering fees & unit price, which has a quotation formula and can be simply expressed by following piecewise function:
             Testing charges = Engineering Fees                        ( if testing quantity are not more than 100 pcs)
             Testing charges = Engineering Fees + (Testing quantity -100) X Unit Price     (if more than 100 pcs)
             This quotation formula is also applicable to TestLevel II, III,IV &V.  
KFT Deficiencies:
       Key Functional Test (KFT) is a test method conducted to test the devices function under not strict / critical but relaxed conditions, therefore the testing requirements for relevant parameters (e.g: frenquency, timing, voltage load etc) are not quite strict.The following diagram illustrates the Key Functional Test Timing for static 256 X 4 RAM. The RAM AC specifications indicate that it's working at the frequency of 66HZ. The KFT are conducting under relaxed input level, output level and timing conditions.This example displays the test frequency are from 1-66 HZ, and all the parameters such as set time, retention time, propagation delay are relaxed. It's also indicate the VIL, VIH & VOH value under relaxed conditions.

        Even the devices passed KFT test, further more strict test(e.g: Level IV, V ) is reqired to ensure that the devices are fully in compliance with original datasheet /specifications. Once the devices failed in the more strict test (e.g: Level IV, V), the conditional KFT can be performed to gather  a large quantities of valuable information for analysis.

       1, Key Functional Test (KFT) does not consider / test the DUT parameter limits (maximum & minimum value). e.g: limits of signal speed transferring speed,frequency, timing, voltage load etc.
       2, Key Functional Test (KFT)  does not consider / test the DUT under special environment such as high/low/elevated temperatures.
       3, Key Functional Test (KFT) does not include the testing items in Level I AIV test.