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China Electronic Components Center Laboratory (CECC Lab), as a lawful established, professional, global independent third party electronic components testing & verification organization, strives to help the electronic components distributors, brokers, resellers, vendors, buyers, IC design houses, EMS manufacturers etc to smooth their way in the market / incoming parts channels by providing inspection, testing, verifying services / solutions to identify good, faulty, defected, counterfeit electronic components. CECC Lab also strives to provide clients satisfying feasible value-added service / solutions such as sales & customized testing jigs, devices for specified electronic components, IC replacements / alternatives solutions, IC obsolescence parts inquiry, IC PCN / PDN inquiry, IC quality disputes handling & coordination, Electronic components third party ESCROW services etc.
CECC Lab is a State Key Laboratory of electronic components under cultivation in China, member of China Semiconductor Industry Association(CSIA), member of sub-branch of international electronic components quality assessment system (IECQ-CECC) in China, also member of ERAI and designated testing lab for the world largest IC trading platform --Broker Forum. CECC Lab adopts the international standards such as JEDEC standards, MIL-STD-883 standards, IPC standards etc for electronic components testing & analysis.All the testing items in CECC Lab are in strict compliance with relevant international industry standards & OEM specifications (datasheet). The testing methodologies & testing reports issued by CECC Lab have gained popular unanimous approval from both domestic & international IC industrial units, organizations, companies & authorities.
CECC Lab consolidates the hardware resources of National Integrated Circuits Base(Shenzhen), Hongkong Science & Technology University, China Academy of Micro Electronics Sciences, Peking University and South China Science & Technology University with the aim to build a most comprehensive & advanced high-end IC testing & verifying platform in China. CECC Lab currently possesses a group of international first-class IC tester & analysis equipments as following:
Electra MSR 100MHz of the US Credence Co.,
The V777 Large Scale IC Logical Testing System of Japan VTT Co.
Teradyne J750 mixed-signal tester
ADVANTEST R6741A Multi-Channel Power Supply
ADVANTEST TR6846 Digital Multimeter
Agilent 16804A High-end Logic Analyzer, Agilent 81133A 3.5 GHz Signal Generator,
Agilent E4443A Spectrum Analyzer
Verigy V50 tester
Tektronix DSA70604 6GHz Oscilloscope, Tektronix TDS2024 Oscilloscope from Germany
Rohde&Schwarz ZVA40 High-Performance Network Analyzer from Germany
Rohde&Schwarz NRP Power Meter from Germany
Equipments & Instruments for Failure Analysis:
Decapsulation Machine, Scanning Electron Microscope (SEM)
X-Ray Fluoroscopic Machine
Emission Microscope (EMMI) Low light Microscopy for microcircuit modification.
Equipments & Instruments for reliability & special environment testing & analysis:
Electro static discharge (ESD) & Latch-up tester, Thermal shock test Oven, RoHS Fluoroscopic Detector.
These assets with total value of more than 200,000,000(two hundred million), has basically met the demand for medium / high end IC testing & verification and filled the gap of IC industry in domestic IC testing & verification sections.
CECC engineers have successfully completed & researched as much as of 20,000 IC engineering cases and accumulated a wealth of practical experiences in the past five years. Based on the rich experiences, CECC engineers have published 19 books related to IC testing & verification which are original from very comprehensive IC experimental data/documents and have become the only practical teaching books for IC testing & verification in China.
Oriented with academic research & motivated by market demands, CECC Lab strives to provide professional IC testing & verification services, devices failure analysis services for weighed IC distributors, EMS manufacturers, medium/ high-end IC design houses home and abroad.
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