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System Level
Chip Level
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Thermal Shock Test
Burn-in Test
ESD/Latch up Test


Electro-Optical Experiments Materials Analysis
RoHS / Lead-free Test

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Types of Devices can be tested
Logic Devices, FPGA, CPLD,PLD
ASIC、SoC Devices, Processor
Data Convertable IC, Memory
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Test Reports General Declaration

Testing Level Definitions
Level I  AIV (Authenticity...)
Level II DCCT (Direct...)
Level III KFT (Key Functiona...)
Level IV FFCT (Full Function...)
Capabilities of Test Equipments
Test Sockets and Fixture
New Instruments Development

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IC Test Engineering Solutions
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Function Characteristics Analysis
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Military & Aerospace IC Test
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IC Design-Chip Level Design IP Database
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