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System Level
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SEM　SAM　EDX　LCA　FIB
X-Ray　EMMI　OBRIRCH
Thermal Shock Test
Burn-in Test
ESD/Latch up Test

Solderab
Chemical
Deproces

Electro-Optical Experiments　Materials Analysis
RoHS / Lead-free Test
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Types of Devices can be tested
Logic Devices, FPGA, CPLD,PLD
ASIC、SoC Devices, Processor
Data Convertable IC, Memory
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Testing Level Definitions
Level I  AIV (Authenticity...)
Level II DCCT (Direct...)
Level III KFT (Key Functiona...)
Level IV FFCT (Full Function...)
Capabilities of Test Equipments
Test Sockets and Fixture
New Instruments Development

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